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for the civil engineering industry

Building better technology
for the civil engineering industry

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Tel: +44 (0)118 945 3737

Tel: +44 (0)118 945 3737

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Bender Element Testing System


Bender Testing System

For prices: call +44 (0)118 945 3737 or Email us

The VJ Tech Bender Element Testing;

  • Non-destructive way of determining the small strain shear (GMax)
  • Top Cap and Base Pedestal have piezoelectric elements which protrude into the sample
  • A wave is sent through the sample from the Transmitter in the Top Cap to the Receiver in the Base Pedestal and the received waveforms are compared using our software
  • For S-Waves, the shorter cable (Parallel A) connects the Top Cap Lemo connector to the Top (Tx) socket on the Bender Scope and the longer cable (Serial B) connects the Base Pedestal Lemo Connector to the Base (Rx) socket on the Bender Scope
  • These two cables are then interchanged for sending P-Waves
  • Horizontal bender elements can be inserted on opposing sides of the sample and sealed with specially adapted grommets
  • Signals are processed by our Bender Scope and sent on to PC

Bender Element Testing System

Features:

  • Piezoelectric elements encased in titanium for minimal weight
  • Vertical and Horizontal S and P-Wave capabilities
  • Built-in signal generator with Sinusoidal, Square or Triangular Waveforms
  • Up to 5 million samples/sec
  • USB Interface cable include for connection to PC
  • User friendly test setup on an individual client, job, borehole and sample basis
  • Selectable Pulse Frequency between 0.1 kHz to 50 kHz
  • Selectable Amplitude values from 1 to 12 Volts
  • Sinusoidal, Square or Triangular waveform
  • Single or automated multiple pulse generation with defined interval between pulses
  • Low pass filter setup capability
  • Display of captured wave data in graphical format (single & stacked)
  • Easily viewed results with common data export options
  • On screen cursors for travel time measurement
  • Calculation of GMax

System Options:

  • 38 mm (1.5 inch) sample in 50 mm (2 inch) Cell
  • 38 mm (1.5 inch) sample in 100 mm (4 inch) Cell
  • 50 mm (2 inch) sample in 50 mm (2 inch) Cell
  • 50 mm (2 inch) sample in 100 mm (4 inch) Cell
  • 70 mm (2.75 inch) sample in 75 mm (3 inch) Cell
  • 100 mm (4 inch) sample in 100 mm (4 inch) Cell

Detailed product specifications

Maximum A/D Resolution     16 bit
Pulse Frequency Range Selectable from 0.1 kHz to 50 kHz
Amplitude Ramge 1 to 12 Volts
Waveforms Sinusoidal, Square or Triangular
PC Interface USB

Accessorize your purchase with these related items

Clisp Studio Bender Software Module
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Triaxial Cell (100 mm (4")) for Bender Elements & On-sample Transducers
Triaxial Cell (100 mm (4")) for Bender Elements & On-sample Transducers
Dynamic (Cyclic) Triaxial Cell (100mm (4"))
Dynamic (Cyclic) Triaxial Cell (100mm (4"))
Dynamic Triaxial Cell (150 mm (6")) with Balance Ram
Dynamic Triaxial Cell (150 mm (6")) with Balance Ram
Dynamic (Cyclic) Triaxial Cell (75 mm (3"))
Dynamic (Cyclic) Triaxial Cell (75 mm (3"))
Bender Elements in 50mm Top Cap & Base Pedestal (Set) for TC100
Bender Elements in 50mm Top Cap & Base Pedestal (Set) for TC100
Bender Elements in 100 mm Top Cap & Base Pedestal (Set)
Bender Elements in 100 mm Top Cap & Base Pedestal (Set)

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