Building better technology
for the civil engineering industry

Building better technology
for the civil engineering industry

Tel: +44 (0)118 945 3737

Tel: +44 (0)118 945 3737

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Bender Element Testing System


Bender Testing System

Part Number : VJT9050
For prices: call +44 (0)118 945 3737 or Email us

The VJ Tech Bender Element Testing;

  • Non-destructive way of determining the small strain shear (GMax)
  • Wave is sent from a Transmitter to a Receiver through the sample
  • Top Cap and Base Pedestal have piezoelectric elements which protrude into the sample
  • Transmitted and received waveforms are compared using our software
  • S-Wave testing is from the Top Cap Element to the Base Receiver
  • P-Wave testing is from the Base Pedestal Element to the Top Receiver
  • Horizontal bender elements can be inserted on opposing sides of the sample and sealed with specially adapted grommets
  • Signals are processed by our Bender Element Interface Unit and sent on to PC

Bender Element Testing System

Features:

  • Piezoelectric elements encased in titanium for minimal weight
  • Vertical and Horizontal S and P-Wave capabilities
  • Built-in signal generator with Sinusoidal, Square or Triangular Waveforms
  • Up to 5 million samples/sec
  • USB Interface cable include for connection to PC
  • User friendly test setup on an individual client, job, borehole and sample basis
  • Selectable Pulse Frequency between 0.1 kHz to 50 kHz
  • Selectable Amplitude values from 1 to 12 Volts
  • Sinusoidal, Square or Triangular waveform
  • Single or automated multiple pulse generation with defined interval between pulses
  • Low pass filter setup capability
  • Display of captured wave data in graphical format (single & stacked)
  • Easily viewed results with common data export options
  • On screen cursors for travel time measurement
  • Calculation of GMax

System Options:

  • 38 mm (1.5 inch) sample in 50 mm (2 inch) Cell
  • 38 mm (1.5 inch) sample in 100 mm (4 inch) Cell
  • 50 mm (2 inch) sample in 50 mm (2 inch) Cell
  • 50 mm (2 inch) sample in 100 mm (4 inch) Cell
  • 70 mm (2.75 inch) sample in 75 mm (3 inch) Cell
  • 100 mm (4 inch) sample in 100 mm (4 inch) Cell

Detailed product specifications

Maximum A/D Resolution     16 bit
Pulse Frequency Range Selectable from 0.1 kHz to 50 kHz
Amplitude Ramge 1 to 12 Volts
Waveforms Sinusoidal, Square or Triangular
PC Interface USB

Product Documentation

Bender Scope System Datasheet
Download

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Bender Elements in 100 mm Top Cap & Base Pedestal (Set)
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Bender Elements in 50mm Top Cap & Base Pedestal (Set) for TC100
Bender Elements in 50mm Top Cap & Base Pedestal (Set) for TC100
Triaxial Cell (100mm (4")) for Bender Elements & On-sample Transducers
Triaxial Cell (100mm (4")) for Bender Elements & On-sample Transducers
Dynamic (Cyclic) Triaxial Cell (100mm (4"))
Dynamic (Cyclic) Triaxial Cell (100mm (4"))
Dynamic Triaxial Cell (150 mm (6")) with Balance Ram
Dynamic Triaxial Cell (150 mm (6")) with Balance Ram
Dynamic (Cyclic) Triaxial Cell (75 mm (3"))
Dynamic (Cyclic) Triaxial Cell (75 mm (3"))
Dynamic (Cyclic) Triaxial Cell (50 mm (2"))
Dynamic (Cyclic) Triaxial Cell (50 mm (2"))

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