Building better technology
for the civil engineering industry

Building better technology
for the civil engineering industry

Tel: +44 (0)118 945 3737

Tel: +44 (0)118 945 3737

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Bender Element Testing System


VJ Tech has developed a system to undertake Bender Element testing, a non-destructive way of determining the small strain shear modulus (GMax) of a soil sample. The test basically consists of sending a wave from a transmitting element, through a soil sample to a receiving element and comparing the transmitted and received waveforms using VJ Tech (csBENDER) software. The transmission and reception is undertaken using piezoelectric elements mounted in the Top Cap and Base Pedestal which protrude into the sample assembled in an adapted Triaxial Cell or a Dynamic Triaxial Cell. Both S-Wave and P-Wave testing can be performed, i.e. from the Top Cap element to the Base Pedestal element and vice-versa. S and P waves can also be transmitted horizontally through the sample using horizontal bender elements inserted on opposing sides of the sample that are sealed with specially adapted sealing ‘O’ Rings. Select 'Related Products' tab for details of system setup
Part Number : VJT9050
For prices: call +44 (0)118 945 3737 or Email us

Bender Element Testing System

  • Features:
  • Piezoelectric elements encased in titanium for minimal weight
  • Vertical and Horizontal S and P-Wave capabilities
  • Built-in signal generator with Sinusoidal, Square or Triangular Waveforms
  • Up to 5 million samples/sec
  • USB Interface cable include for connection to PC
  • User friendly test setup on an individual client, job, borehole and sample basis
  • Selectable Pulse Frequency between 0.1 kHz to 50 kHz
  • Selectable Amplitude values from 1 to 12 Volts
  • Sinusoidal, Square or Triangular waveform
  • Single or automated multiple pulse generation with defined interval between pulses
  • Low pass filter setup capability
  • Display of captured wave data in graphical format (single & stacked)
  • Easily viewed results with common data export options
  • On screen cursors for travel time measurement
  • Calculation of GMax

System Options:

  • 38 mm (1.5 inch) sample in 50 mm (2 inch) Cell
  • 38 mm (1.5 inch) sample in 100 mm (4 inch) Cell
  • 50 mm (2 inch) sample in 50 mm (2 inch) Cell
  • 50 mm (2 inch) sample in 100 mm (4 inch) Cell
  • 70 mm (2.75 inch) sample in 75 mm (3 inch) Cell
  • 100 mm (4 inch) sample in 100 mm (4 inch) Cell

Detailed product specifications

Maximum A/D Resolution     16 bit
Pulse Frequency Range Selectable from 0.1 kHz to 50 kHz
Amplitude Ramge 1 to 12 Volts
Waveforms Sinusoidal, Square or Triangular
PC Interface USB

Product Documentation

Bender Scope System Datasheet
Download

Accessorize your purchase with these related items

Clisp Studio Bender Software Module
Clisp Studio Bender Software Module
Bender Element Interface Unit
Bender Element Interface Unit
Bender Elements in 100 mm Top Cap & Base Pedestal (Set) for TC100
Bender Elements in 100 mm Top Cap & Base Pedestal (Set) for TC100
Triaxial Cell (100mm (4")) for Bender Elements & On-sample Transducers
Triaxial Cell (100mm (4")) for Bender Elements & On-sample Transducers
Dynamic (Cyclic) Triaxial Cell (100mm (4"))
Dynamic (Cyclic) Triaxial Cell (100mm (4"))

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